| Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
| openAccess |  | 2019 | A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors | Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
| openAccess |  | 2019 | A flexible characterization methodology of RRAM: Application to the modeling of the conductivity changes as synaptic weight updates | Pedro, M.; Martín-Martínez, Javier; Rodríguez, R.; González, M. B.; Campabadal, Francesca CSIC ORCID ; Nafría, Montserrat | artículo |
| openAccess |  | 2020 | A Robust and Automated Methodology for the Analysis of Time-Dependent Variability at Transistor Level | Saraza-Canflanca, P. CSIC ORCID; Díaz-Fortuny, J.; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
| closedAccess |  | 2017 | A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs | Martín-Lloret, P. CSIC; Toro-Frias, A. CSIC; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
| openAccess |  | 2019 | A smart noise- and RTN-removal method for parameter extraction of CMOS aging compact models | Díaz-Fortuny, Javier; Martín-Martínez, Javier; Rodriguez, Rosana; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
| openAccess |  | 11-jul-2022 | A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation | Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
| openAccess |  | dic-2018 | A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI | Díaz-Fortuny, Javier; Martín-Martínez, Javier; Rodríguez, Rosana; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Aragonés, Xavier; Barajas, Enrique; Mateo, Diego; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
| openAccess |  | 2019 | An unsupervised and probabilistic approach to Pavlov's dog experiment with OxRAM devices | Pedro, M.; Martín-Martínez, Javier; Rodríguez, R.; González, M. B.; Campabadal, Francesca CSIC ORCID ; Nafría, Montserrat | artículo |
| openAccess |  | 29-jun-2015 | Dedicated Random Telegraph Noise Characterization of Ni/HfO2-based RRAM Devices | González, M. B.; Martín-Martínez, Javier; Rodríguez, Rosana; Acero Leal, María Cruz CSIC ORCID ; Nafría, Montserrat; Campabadal, Francesca CSIC ORCID ; Aymerich, Xavier | comunicación de congreso |
| openAccess |  | 1-oct-2022 | Determination of the time vonstant distribution of a defect-ventric time-dependent variability model for sub-100-nm FETs | Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
| openAccess |  | 2020 | Flexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated Circuits | Díaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
| closedAccess |  | ago-2016 | Investigation of Filamentary Current Fluctuations Features in the High-Resistance State of Ni/HfO2-Based RRAM | González, M. B.; Martín-Martínez, Javier; Maestro, Marcos; Acero Leal, María Cruz CSIC ORCID ; Nafría, Montserrat; Campabadal, Francesca CSIC ORCID | artículo |
| closedAccess |  | 8-feb-2017 | Ni/HfO2/Si resistive switching structures: A device level and nanoscale analysis with CAFM | Claramunt, S.; Wu, Q.; Maestro, Marcos; Porti, M.; Acero Leal, María Cruz CSIC ORCID ; González, M. B.; Martín-Martínez, Javier; Campabadal, Francesca CSIC ORCID ; Nafría, Montserrat | póster de congreso |
| openAccess |  | 27-may-2022 | On the impact of the biasing history on the characterization of random telegraph noise | Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
| closedAccess |  | sep-2016 | Reliability simulation for analog ICs: Goals, solutions, and challenges | Toro-Frias, A. CSIC; Martín-Lloret, P. CSIC; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCID | artículo |
| openAccess |  | 2021 | Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation | Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
| openAccess |  | 2021 | Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions | Díaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Rodríguez, Rosana; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
| openAccess |  | 2021 | Unified RTN and BTI statistical compact modeling from a defect-centric perspective | Pedreira, G.; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserrat | artículo |
