Por favor, use este identificador para citar o enlazar a este item:
http://hdl.handle.net/10261/30542
COMPARTIR / EXPORTAR:
SHARE CORE BASE | |
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Campo DC | Valor | Lengua/Idioma |
---|---|---|
dc.contributor.author | Ros, Lluís | - |
dc.contributor.author | Thomas, Federico | - |
dc.date.accessioned | 2010-12-17T13:16:49Z | - |
dc.date.available | 2010-12-17T13:16:49Z | - |
dc.date.issued | 2002 | - |
dc.identifier.citation | IEEE Transactions on Pattern Analysis and Machine Intelligence 24(4): 456-466 (2002) | - |
dc.identifier.issn | 0162-8828 | - |
dc.identifier.uri | http://hdl.handle.net/10261/30542 | - |
dc.description.abstract | Presents an algorithm for correcting incorrect line drawings-incorrect projections of a polyhedral scene. Such incorrect drawings arise, e.g., when an image of a polyhedral world is taken, the edges and vertices are extracted, and a drawing is synthesized. Along the way, the true positions of the vertices in the 2D projection are perturbed due to digitization errors and the preprocessing. As most available algorithms for interpreting line drawings are "superstrict," they judge these noisy inputs as incorrect and fail to reconstruct a three-dimensional scene from them. The presented method overcomes this problem by moving the positions of all vertices until a very close correct drawing is found. The closeness criterion is to minimize the sum of squared distances from each vertex in the input drawing to its corrected position. With this tool, any superstrict method for line drawing interpretation is now practical, as it can be applied to the corrected version of the input drawing. | - |
dc.description.sponsorship | This work was supported by the project 'Computación mediante restricciones en robótica y gestión de recursos' (070-725). this research has been partially funded by the Spanish CICYT under contract TAP-99-1086-C03-01. | - |
dc.language.iso | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers | - |
dc.relation.isversionof | Publisher's version | - |
dc.rights | openAccess | - |
dc.title | Overcoming superstrictness in line drawing interpretation | - |
dc.type | artículo | - |
dc.identifier.doi | 10.1109/34.993554 | - |
dc.description.peerreviewed | Peer Reviewed | - |
dc.relation.publisherversion | http://dx.doi.org/10.1109/34.993554 | - |
dc.type.coar | http://purl.org/coar/resource_type/c_6501 | es_ES |
item.openairetype | artículo | - |
item.languageiso639-1 | en | - |
item.grantfulltext | open | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.fulltext | With Fulltext | - |
item.cerifentitytype | Publications | - |
Aparece en las colecciones: | (IRII) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
---|---|---|---|---|
Overcoming superstrictness.pdf | 1,33 MB | Adobe PDF | Visualizar/Abrir |
CORE Recommender
SCOPUSTM
Citations
32
checked on 06-may-2024
WEB OF SCIENCETM
Citations
27
checked on 29-feb-2024
Page view(s)
363
checked on 06-may-2024
Download(s)
269
checked on 06-may-2024
Google ScholarTM
Check
Altmetric
Altmetric
NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.