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Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
closedAccess | | 2020 | IBIC analysis of SiC detectors developed for fusion applications | Jiménez-Ramos, M. C. CSIC ORCID; García López, J. CSIC ORCID; García-Osuna, Adrián; Rodríguez-Ramos, M. CSIC ORCID; Villalpando Barroso, A.; García-Muñoz, M.; Andrade, Eduardo; Pellegrini, Giulio CSIC ORCID; Otero Ugobono, Sofia; Godinho, V. CSIC ORCID; Rafí, J. M. CSIC ORCID ; Rius, Gemma CSIC ORCID | artículo |
openAccess | | 7-feb-2005 | Impact of direct plasma hydrogenation on thermal donor formation in n-type CZ silicon | Rafí, J. M. CSIC ORCID ; Simoen, E.; Claeys, C.; Huang, Y. L.; Ulyashin, A. G.; Job, R.; Versluys, J.; Clauws, P.; Lozano, M.; Campabadal, Francesca CSIC ORCID | artículo |
openAccess | | 2013 | Impact of electrical stress on the electrical characteristics of 2 MeV electron irradiated metal-oxide-silicon capacitors with atomic layer deposited Al<inf>2</inf>O<inf>3</inf>, HfO<inf>2</inf> and nanolaminated dielectrics | Rafí, J. M. CSIC ORCID ; González, M. B.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Beldarrain, O.; Zabala, Miguel; Campabadal, Francesca CSIC ORCID | artículo |
openAccess | | 2004 | Impact of gate tunneling floating-body charging on drain current transients of 0.10 μm-CMOS partially depleted SOI MOSFETs | Rafí, J. M. CSIC ORCID ; Mercha, A.; Simoen, E.; Claeys, C. | artículo |
openAccess | | 1-ene-2005 | Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin gate oxide partially depleted SOI nMOSFETs | Rafí, J. M. CSIC ORCID ; Simoen, E.; Mercha, A.; Campabadal, Francesca CSIC ORCID ; Claeys, C. | artículo |
openAccess | | 1-dic-2004 | Impact of radiation-induced back-channel leakage and back-gate bias on drain current transients of thin-gate-oxide partially depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistors | Rafí, J. M. CSIC ORCID ; Mercha, Abdelkarim; Simoen, Eddy; Hayama, Kiyoteru; Claeys, C. | artículo |
openAccess | | 2009 | Impact of silicon substrate germanium doping on diode characteristics and on thermal donor formation | Rafí, J. M. CSIC ORCID ; Vanhellemont, J.; Simoen, E.; Chen, J.; Zabala, Miguel; Campabadal, Francesca CSIC ORCID | artículo |
openAccess | | 1-oct-2023 | Low-Temperature Annealing of Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors | Rafí, J. M. CSIC ORCID ; Pellegrini, Giulio CSIC ORCID; Godignon, Philippe; Rius, Gemma CSIC ORCID ; Dauderys, Vainius; Tsunoda, Isao; Yoneoka, Masashi; Takakura, Kenichiro; Kramberger, Gregor; Moll, Michael | artículo |
openAccess | | 31-may-2022 | Monolithic Integration of Graphene in SiC Radiation Sensors for Harsh-Environment Applications | Otero Ugobono, Sofia; Rafí, J. M. CSIC ORCID ; Godignon, Philippe; Pellegrini, Giulio CSIC ORCID; Rius, Gemma CSIC ORCID ; Jiménez-Ramos, M. C. CSIC ORCID; García López, J. CSIC ORCID; García-Osuna, Adrián | artículo |
closedAccess | | 2009 | Patterning of ALD HfO2 layers on silicon | Andreu, Robert; Sanchez, Javier; Sanchez, Ana; Zabala, Miguel; Acero Leal, María Cruz CSIC ORCID ; Rafí, J. M. CSIC ORCID ; Campabadal, Francesca CSIC ORCID | artículo |
openAccess | | 17-feb-2009 | Progressive degradation of TiNSiON and TiNHf O2 gate stack triple gate SOI nFinFETs subjected to electrical stress | Rafí, J. M. CSIC ORCID ; Simoen, E.; Mercha, A.; Collaert, Nadine; Campabadal, Francesca CSIC ORCID ; Claeys, C. | artículo |
closedAccess | | ene-2024 | Spectrometric performance of SiC radiation detectors at high temperature | Jiménez-Ramos, M. C. CSIC ORCID; García-Osuna, Adrián; Rodríguez-Ramos, M. CSIC ORCID; Viezzer, Eleonora CSIC ORCID; Pellegrini, Giulio CSIC ORCID; Godignon, Philippe; Rafí, J. M. CSIC ORCID ; Rius, Gemma CSIC ORCID; García López, J. CSIC ORCID | artículo |
closedAccess | | 24-may-2007 | Technology of p-type microstrip detectors with radiation hard p-spray, p-stop and moderated p-spray insulations | Pellegrini, Giulio CSIC ORCID; Fleta, Celeste CSIC ORCID ; Campabadal, Francesca CSIC ORCID ; Miñano, Mercedes CSIC ORCID; Lozano Fantoba, Manuel CSIC ORCID ; Rafí, J. M. CSIC ORCID ; Ullán Comes, Miguel | artículo |
openAccess | | 2000 | Transconductance increase due to charge trapping during hot-carrier stress of nMOSFETs | Rafí, J. M. CSIC ORCID ; Campabadal, Francesca CSIC ORCID | artículo |
openAccess | | 6-ago-2007 | Ultimate limits for the radiation hardness of silicon strip detectors for sLHC | Lozano Fantoba, Manuel CSIC ORCID ; Campabadal, Francesca CSIC ORCID ; García García, Carmen CSIC ORCID; González Sevilla, Sergio CSIC ORCID; Lacasta Llácer, Carlos CSIC ORCID ; Lacuesta, Vicente CSIC; Martí García, Salvador; Miñano, Mercedes CSIC ORCID; Pellegrini, Giulio CSIC ORCID; Ullán Comes, Miguel ; Rafí, J. M. CSIC ORCID | artículo |
openAccess | | 1-nov-2023 | Ultrathin four-quadrant silicon photodiodes for beam position and monitor applications: Characterization and radiation effects | Rafí, J. M. CSIC ORCID ; Quirion, D.; Duch, M.; Lopez Paz, I.; Dauderys, V.; Claus, T.; Moffat, N.; Molas, B.; Tsunoda, I.; Yoneoka, M.; Takakura, K.; Kramberger, G.; Moll, M.; Pellegrini, G. | artículo |