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1openAccessArticle_VLSI_1672_Complete.pdf.jpg2020A Robust and Automated Methodology for the Analysis of Time-Dependent Variability at Transistor LevelSaraza-Canflanca, P. CSIC ORCID; Díaz-Fortuny, J.; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, R.; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCIDartículo
2openAccess08599047.pdf.jpg2020A Multilevel Bottom-up Optimization Methodology for the Automated Synthesis of RF SystemsPassos, Fábio CSIC ORCID; Roca, Elisenda CSIC ORCID ; Sieiro, Javier; Fiorelli, Rafaella CSIC ORCID; Castro-López, R. CSIC ORCID ; López-Villegas, J.M.; Fernández, Francisco V. CSIC ORCIDartículo
3openAccessTCAD_mmWave_rev6-1.pdf.jpg2020Synthesis of mm-Wave Wideband Receivers in 28-nm CMOS Technology for Automotive Radar ApplicationsPassos, Fábio CSIC ORCID; Chanca, Miguel; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Fernández, Francisco V. CSIC ORCIDartículo
4openAccessPACOSYT_DigitalCSIC.pdf.jpg1-abr-2023PACOSYT: A Passive Component Synthesis Tool Based on Machine Learning and Tailored Modeling Strategies Towards Optimal RF and mm-Wave Circuit DesignsPassos, Fabio; Lourenco, Nuno; Roca, Elisenda CSIC ORCID ; Martins, Ricardo; Castro-López, R. CSIC ORCID ; Horta, Nuno; Fernández, Francisco V. CSIC ORCIDartículo
5openAccessTIM2019.pdf.jpg2020Flexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated CircuitsDíaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo
6openAccessSRAM-PUFs.pdf.jpg1-mar-2024Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of agingSantana-Andreo, A. CSIC ORCID; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernandez, F. V.; Fernández, Francisco V. CSIC ORCIDartículo
7openAccessEXTENDED_final_clean.pdf.jpg2021Unified RTN and BTI statistical compact modeling from a defect-centric perspectivePedreira, G.; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo
8openAccessMICREL_2020_final.pdf.jpg2021Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradationSaraza-Canflanca, P. CSIC ORCID; Carrasco-López, H. CSIC; Santana-Andreo, A. CSIC ORCID; Brox, Piedad CSIC ORCID ; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCIDartículo
9openAccessTED_PDO_revised_aug22_v1.pdf.jpg1-oct-2022Determination of the time vonstant distribution of a defect-ventric time-dependent variability model for sub-100-nm FETsSaraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCIDartículo
10openAccessTED_newresubmission_clean_final.pdf.jpg2021Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current FluctuationSaraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Rodríguez, R.; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo

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