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Navegación por Autor Diaz-Fortuny, J.
Mostrando resultados 1 a 4 de 4
Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
openAccess | | 22-may-2019 | A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices | Pedreira, G.; Martin-Martinez, J.; Diaz-Fortuny, J.; Saraza-Canflanca, P. CSIC ORCID; Rodriguez, R.; Castro-López, R. CSIC ORCID ; Roca, E.; Fernandez, F. V.; Nafria, M. | comunicación de congreso |
openAccess | | 19-abr-2021 | Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblock | Nafria, M.; Diaz-Fortuny, J.; Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Martín-Lloret, P. CSIC; Toro-Frias, A. CSIC; Mateo, D.; Barajas, E.; Aragones, X.; Fernández, Francisco V. CSIC ORCID | comunicación de congreso |
openAccess | | 14-may-2019 | New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors | Saraza-Canflanca, P. CSIC ORCID; Diaz-Fortuny, J.; Castro-López, R. CSIC ORCID ; Roca, E.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | comunicación de congreso |
openAccess | | 1-jul-2019 | TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level | Saraza-Canflanca, P. CSIC ORCID; Diaz-Fortuny, J.; Castro-López, R. CSIC ORCID ; Roca, E.; Martin-Martinez, J.; Rodriguez, R.; Nafria, M.; Fernandez, F. V. | comunicación de congreso |