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dc.contributor.authorBerrah, N.-
dc.contributor.authorRolles, D.-
dc.contributor.authorZhang, Hong-
dc.contributor.authorDíez Muiño, Ricardo-
dc.contributor.authorGarcía de Abajo, Francisco Javier-
dc.date.accessioned2012-07-18T12:57:02Z-
dc.date.available2012-07-18T12:57:02Z-
dc.date.issued2009-
dc.identifier.citationThe European Physical Journal 169(1): 59-65 (2009)es_ES
dc.identifier.urihttp://hdl.handle.net/10261/53536-
dc.description7 páginas, 4 figuras.-- et al.es_ES
dc.description.abstractInner-shell and valence-shell photoionization of van-der-Waals Xe clusters have been measured using both angle-resolved photoelectron spectroscopy and velocity map ion imaging technique. Both techniques have been used to probe the electronic properties and the fragmentation dynamics of clusters as a function of photon energy and cluster size. In particular, the evolution of the photoelectron angular distributions and partial cross sections as a function of photon energy and cluster size has revealed cluster size effects similar to the ones found in solids. Our cluster angular distribution parameters have been compared to the free atoms. In addition, the measurement of the fragmentation dynamic of the clusters seems to be photon energy dependent.es_ES
dc.description.sponsorshipThe work was supported by the Office of Basic Energy Sciences, US Department of Energy, Chemical Sciences, Geosciences and Biosciences Division. DR is grateful to the Alexander von Humboldt foundation for support through the Feodor Lynen program.es_ES
dc.language.isoenges_ES
dc.publisherSpringer Naturees_ES
dc.rightsclosedAccesses_ES
dc.titleProbing free xenon clusters from withines_ES
dc.typeartículoes_ES
dc.identifier.doi10.1140/epjst/e2009-00973-0-
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1140/epjst/e2009-00973-0es_ES
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
item.openairetypeartículo-
item.fulltextNo Fulltext-
item.languageiso639-1en-
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