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Título: | Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films. |
Autor: | Bretos, Íñigo CSIC ORCID; Alonso-San-José, David; Jiménez, Ricardo CSIC ORCID; Ricote, J. CSIC ORCID ; Calzada, M. L. CSIC ORCID | Palabras clave: | Dielectrics Ferroelectrics Perovskites Thin films |
Fecha de publicación: | sep-2011 | Editor: | Elsevier BV | Citación: | Materials Letters 65: 2714- 2716 (2011) | Resumen: | [EN] Lead-free (Bi0.5Na0.5)1-xBaxTiO3 (BNBT) thin films with compositions at x = 0.055, 0.100, and 0.150 were prepared by chemical solution deposition on Pt/TiO2/SiO2/(100)Si substrates. The dielectric behavior of the films was studied, and the ferroelectricantiferroelectric phase transition observed was used to situate the morphotropic phase boundary (MPB) for compositions with x ~0.100 (BNBT-10), a value that differs from that reported for bulk materials (BNBT-5.5). Extrinsic effects derived from the thin-film configuration (e.g., microstrains, residual stresses) may be responsible for the shift of the MPB. Consequently, the dielectric permittivity is significantly improved for this composition, showing the best ferroelectric response obtained up to now for films of the BNBT system (Pr = 13.0 µC/cm2, Ec = 70 kV/cm). | Versión del editor: | https://doi.org/10.1016/j.matlet.2011.05.111 | URI: | http://hdl.handle.net/10261/345768 | DOI: | 10.1016/j.matlet.2011.05.111 | Identificadores: | issn: 0167-577X |
Aparece en las colecciones: | (ICMM) Artículos |
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