Por favor, use este identificador para citar o enlazar a este item:
http://hdl.handle.net/10261/99538
COMPARTIR / EXPORTAR:
SHARE CORE BASE | |
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
Título: | Reduction of the deposition temperature of high quality EuO films on Yttria Stabilized Zirconia by incorporating an MgO buffer layer |
Autor: | García, Gemma; Santiso, José CSIC ORCID | Palabras clave: | Textured growth Molecular Beam Epitaxy Ferromagnetic semiconductor Europium monoxide |
Fecha de publicación: | 2013 | Editor: | Elsevier | Citación: | Thin Solid Films 531: 466-470 (2013) | Resumen: | High quality stoichiometric EuO ferromagnetic thin films have been grown by Molecular Beam Epitaxy (MBE) on MgO coated-Yttria Stabilized Zirconia (YSZ) (100) substrates. The proof is made that introducing an MgO buffer layer, that avoid oxygen transfer from YSZ to EuO, allows the preparation of high quality stoichiometric EuO films at reduced deposition temperature compared with films directly deposited onto YSZ, maintaining similar Eu flux and oxygen partial pressure. Structure and texture were characterized by X-ray diffraction showing out-of plane and in-plane ordering for films deposited onto MgO buffer layers. The crystallographic quality was corroborated by a Curie temperature around 69 K and a magnetization moment close or equal to 6.49 · 10- 23 J/T (7 μB), corresponding to bulk EuO single crystal values. © 2012 Elsevier B.V. | URI: | http://hdl.handle.net/10261/99538 | DOI: | 10.1016/j.tsf.2012.12.030 | Identificadores: | doi: 10.1016/j.tsf.2012.12.030 issn: 0040-6090 |
Aparece en las colecciones: | (CIN2) Artículos |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
---|---|---|---|---|
accesoRestringido.pdf | 15,38 kB | Adobe PDF | Visualizar/Abrir |
CORE Recommender
SCOPUSTM
Citations
2
checked on 21-abr-2024
WEB OF SCIENCETM
Citations
2
checked on 22-feb-2024
Page view(s)
217
checked on 28-abr-2024
Download(s)
42
checked on 28-abr-2024
Google ScholarTM
Check
Altmetric
Altmetric
NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.