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| Título: | Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current |
Autor: | Perpiñà, X.; Serviere, J. F.; Mermet-Guyennet, M.; Millán, José | Fecha de publicación: | 2006 | Editor: | Elsevier | Citación: | Microelectronics Reliability 46(9-11): 1834-1839 (2006) | Resumen: | Based on the on-state voltage drop monitoring at high current, an alternative method for thermo-sensitive parameters calibration is reported. The main goal is that it allows the simultaneous calibration of the series resistance and power devices voltage drop on temperature. Thereby, the average temperature over all power devices and the temperature difference in average inside the pack can be measured in real applications. | Descripción: | 6 páginas, 6 figuras.-- Trabajo presentado al 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis celebrado en Wuppertal (Alemania) del 3 al 6 de octubre de 2006.-- et al. | Versión del editor: | http://dx.doi.org/10.1016/j.microrel.2006.07.078 | URI: | http://hdl.handle.net/10261/43236 | DOI: | 10.1016/j.microrel.2006.07.078 | ISSN: | 0026-2714 |
| Aparece en las colecciones: | (IMB-CNM) Artículos |
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