Selection of test techniques for high-resolution ΣΔ modulators

Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/3845

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Title:	Selection of test techniques for high-resolution ΣΔ modulators
Authors:	Guerra, Oscar CSIC; Escalera, Sara CSIC; Rosa, José M. de la CSIC ORCID; Compaigne, Eric; Galliard, Christophe; Rodríguez-Vázquez, Ángel CSIC ORCID
Keywords:	Test Sigma-Delta Modulators
Issue Date:	Nov-2000
Citation:	O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.
Abstract:	This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.
URI:	http://hdl.handle.net/10261/3845
ISBN:	2-9522971-0-X
Appears in Collections:	(IMSE-CNM) Comunicaciones congresos