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| Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE | |
| Campo DC | Valor | Lengua/Idioma |
|---|---|---|
| dc.contributor.author | Molina, Sergio I. | - |
| dc.contributor.author | Sales, David L. | - |
| dc.contributor.author | Galindo, P. L. | - |
| dc.contributor.author | Fuster, David | - |
| dc.contributor.author | González Díez, Yolanda | - |
| dc.contributor.author | Alén, Benito | - |
| dc.contributor.author | González Sotos, Luisa | - |
| dc.contributor.author | Varela, María | - |
| dc.contributor.author | Pennycook, Stephen J. | - |
| dc.date.accessioned | 2011-03-23T13:04:05Z | - |
| dc.date.available | 2011-03-23T13:04:05Z | - |
| dc.date.issued | 2009-01 | - |
| dc.identifier.citation | Ultramicroscopy 109(2): 172-176 (2009) | es_ES |
| dc.identifier.issn | 0304-3991 | - |
| dc.identifier.uri | http://hdl.handle.net/10261/33720 | - |
| dc.description | 5 páginas, 3 fiugras, 1 tabla.-- PACS: 81.70.Jb; 61.16.Bg | es_ES |
| dc.description.abstract | A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates. | es_ES |
| dc.description.sponsorship | This work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, US DOE (MVandSJP),the SANDiE European Network of Excellence (Contract No NMP4-CT-2004-500101),the Spanish MEC (TEC2005-05781-C03-01y02,NAN2004-09109-C04-01,Consoli- der-Ingenio2010CSD2006-00019),the CAM(S0505ESP0200) and the Junta de Andalucia(PAI research groups TEP-120 and TIC- 145;project No PAI05-TEP-00383). | es_ES |
| dc.language.iso | eng | es_ES |
| dc.publisher | Elsevier | es_ES |
| dc.rights | closedAccess | es_ES |
| dc.subject | High-resolution electron microscopy | es_ES |
| dc.subject | Z-contrast imaging | es_ES |
| dc.subject | Compositional mapping | es_ES |
| dc.title | Column-by-column compositional mapping by Z-contrast imaging | es_ES |
| dc.type | artículo | es_ES |
| dc.identifier.doi | 10.1016/j.ultramic.2008.10.008 | - |
| dc.description.peerreviewed | Peer reviewed | es_ES |
| dc.relation.publisherversion | http://dx.doi.org/10.1016/j.ultramic.2008.10.008 | es_ES |
| dc.type.coar | http://purl.org/coar/resource_type/c_6501 | es_ES |
| item.openairetype | artículo | - |
| item.languageiso639-1 | en | - |
| item.fulltext | No Fulltext | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
| Aparece en las colecciones: | (IMN-CNM) Artículos | |
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