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dc.contributor.author | Tamayo de Miguel, Francisco Javier | - |
dc.contributor.author | García García, Ricardo | - |
dc.contributor.author | Utzmeier, Thomas | - |
dc.contributor.author | Briones Fernández-Pola, Fernando | - |
dc.date.accessioned | 2010-09-03T07:53:50Z | - |
dc.date.available | 2010-09-03T07:53:50Z | - |
dc.date.issued | 1997 | - |
dc.identifier.citation | Physical Review B Condensed Matter and Materials Physics 55(20): 1-4 (1997) | en_US |
dc.identifier.issn | 1098-0121 | - |
dc.identifier.uri | http://hdl.handle.net/10261/27406 | - |
dc.description.abstract | Using molecular-beam-epitaxy-grown InAs and InSb on InP(001) surfaces, we show that the friction-force microscope is sensitive to monolayer coverage. Those surfaces are characterized by three-dimensional islands separated by flat regions. For a constant load, the frictional forces measured on the InAs island and on the substrate are the same. This is due to the formation of a two-dimensional wetting layer (1.5 ML) of InAs covering the InP(001). The frictional force is controlled by the interaction of this layer and the tip. In contrast, the deposition of 2 ML of InSb on InP(001) produces a different behavior. The frictional force changes when the tip moves from the island to the flat region. Photoluminescence and atomic-force-microscopy experiments show the formation of an InSb submonolayer. The sensitivity of the friction-force microscope to monolayer coverage illustrates its usefulness for wetting-layer analysis. Based on these results we discuss the potential of the friction-force microscope to develop a spatially resolved friction spectroscopy. | en_US |
dc.description.sponsorship | This work was supported by Dirección General de Investigación Científica Técnica of Spain (PB94-0016). | en_US |
dc.format.extent | 183562 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | en_US |
dc.publisher | American Physical Society | en_US |
dc.rights | openAccess | en_US |
dc.subject | MBE | en_US |
dc.subject | InSb | en_US |
dc.subject | InP | en_US |
dc.subject | AFM | en_US |
dc.title | Submonolayer sensitivity of InSb on InP determined by friction-force microscopy | en_US |
dc.type | artículo | en_US |
dc.identifier.doi | 10.1103/PhysRevB.55.R13436 | - |
dc.description.peerreviewed | Peer reviewed | en_US |
dc.relation.publisherversion | http://dx.doi.org/10.1103/PhysRevB.55.R13436 | en_US |
dc.type.coar | http://purl.org/coar/resource_type/c_6501 | es_ES |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.grantfulltext | open | - |
item.openairetype | artículo | - |
item.fulltext | With Fulltext | - |
item.languageiso639-1 | en | - |
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submonolayer.pdf | 179,26 kB | Adobe PDF | Visualizar/Abrir |
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