Energi galeren azterketa, ekorketa eta transmisioko mikroskopia elektronikoan

Abstract

In the last years STEM (Scanning Transmission Electron Microscopy) and specially EELS (Electron Energy Loss Spectgrocopy) has attracted increase interest in different fields of Science as Metallurgy, Medicine and Biology. The analysis of the energy loss experienced by electrons that travel close to interfaces of different shapes allows the study of processes as catalysis or hole drilling with the STEM microscope in some materials. In this work, energy loss experiments will be described, first and then the basis of the dielectric theory used to interprete those experiments will be outlined.