Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/163625
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Título

Simple technique for texture function analysis in granular thin film media

AutorEl-Hilo, M.; Al Saie, J.; Morales, M. P. CSIC ORCID ; Pita, Marcos CSIC ORCID
Palabras claveTexture function
Parallel remanence curve
Simple texture analysis
Fecha de publicación15-nov-2009
EditorElsevier
CitaciónPhysica B: Condensed Matter 404(21): 3991-3994 (2009)
ResumenIn this work a simple technique to extract the texture function in granular thin film media is implemented. The technique is based on previous work in which the distribution function of particles easy axes f(α) is calculated from the measured parallel remanence curve (Mrp(β)). In this simple technique we consider that the measured Mrp(β) curve can be fitted to a series of cos(2β), i.e. Mrp(β)=B0+B2 cos(2β)+B4 cos(4β) where the angle β is the angle by which the film is rotated. This approximation is found to be valid when the texture function has a standard deviation >20°. On this basis, the constants B0, B2 and B4 can be determined by using only three data points for the parallel remanence, Mrp(0), Mrp(45°) and Mrp(90°). The new technique is applied to a textured thin film consisting of cobalt ferrite particles 17 nm in diameter and to a commercial Sony video tape. Using this simple technique, the obtained texture functions are found to be similar to those obtained from the full Mrp(β) curves. This new technique will furnish a simple method with which the texture function in 2D systems can be obtained.
Versión del editorhttps://doi.org/10.1016/j.physb.2009.07.146
URIhttp://hdl.handle.net/10261/163625
DOI10.1016/j.physb.2009.07.146
ISSN0921-4526
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