fotoan.jpg picture
 
Firma en Digital.CSIC (*)
Alegría, Ángel
 
Centro o Instituto
CSIC - Centro de Física de Materiales (CFM)
 
Departamento
Polímeros y materia condensada blanda
 
Especialización
Dynamics of polymer materials and related topics. Dynamical processes ranging from the very local intra-molecualar motions, the cooperative segmental relaxation associated to the glass transition upto the large scale dynamics. In the former case the main objective is to identify the molecular origin of the secondary relaxations in polymers. In the second case there is a two fold objective: i) to know to what extent the segmental dynamics of amorphous polymers share the universal properties of the structural relaxation process of the small molecule glass-forming systems; ii) to understand how the segmental dynamics of a given polymer is modified when this polymer forms a part of a multi-component system. Finally, concerning the large scale dynamics, the main interest is to know the effect of polymer architecture on these processes. The dielectric relaxation techniques are the main experimental tools used in this research. However, the basis of the research methodology consists in combining the dielectric relaxation with other complementary experimental techniques.
 
Email
angel.alegria@ehu.es
 
 
WoS ResearcherID - Publons
 
Scopus AuthorID
 

Refined By:
Autor:  Schwartz, Gustavo A.

Resultados 1-20 de 22.

DerechosPreviewFecha Public.TítuloAutor(es)Tipo
1openAccessadampress.pdf.jpg2007Adam-Gibbs based model to describe the single component dynamics in miscible polymer blends under hydrostatic pressureSchwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
2openAccesshigher eigenmodes.pdf.jpg2014AFM based dielectric spectroscopy: Extended frequency range through excitation of cantilever higher eigenmodesMiccio, Luis A. CSIC ORCID; Kummali, Mohammed M. CSIC; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
3closedAccessjul-2011Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)Schwartz, Gustavo A. CSIC ORCID; Riedel, C.; Arinero, R.; Tordjeman, Ph.; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
4closedAccessaccesoRestringido.pdf.jpg2011Compatibility studies of polystyrene and poly(vinyl acetate) blends using electrostatic force microscopyKummali, Mohammed M. CSIC; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Arinero, R.; Colmenero de León, Juan CSIC ORCIDartículo
5openAccessdescrimode.pdf.jpg2006Describing the component dynamics in miscible polymer blends: Towards a fully predictive modelSchwartz, Gustavo A. CSIC ORCID; Cangialosi, Daniele CSIC ORCID ; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
6openAccessdetermicrosco.pdf.jpg2009Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopyRiedel, C.; Arinero, R.; Tordjeman, Ph.; Ramonda, M.; Lévêque, G.; Schwartz, Gustavo A. CSIC ORCID; Oteyza, Dimas G. de CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
7openAccesshttp___scitation.aip.org10.1063_1.pdf.jpg2011Determining concentration depth profiles in fluorinated networks by means of electric force microscopyMiccio, Luis A. CSIC ORCID; Kummali, Mohammed M. CSIC; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
8openAccessDielectric properties.pdf.jpgabr-2010Dielectric properties of thin insulating layers measured by Electrostatic Force MicroscopyRiedel, C.; Arinero, R.; Tordjeman, Ph.; Lévêque, G.; Schwartz, Gustavo A. CSIC ORCID; Oteyza, Dimas G. de CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
9openAccessDielectric spectroscopy.pdf.jpg2014Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental responseMiccio, Luis A. CSIC ORCID; Kummali, Mohammed M. CSIC; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
10closedAccessaccesoRestringido.pdf.jpg2007Dielectric study of the segmental relaxation of low and high molecular weight polystyrenes under hydrostatic pressureSchwartz, Gustavo A. CSIC ORCID; Colmenero de León, Juan CSIC ORCID; Alegría, Ángel CSIC ORCID artículo
11openAccesshighmixtur.pdf.jpg2009High pressure dynamics of polymer/plasticizer mixturesSchwartz, Gustavo A. CSIC ORCID; Paluch, Marian; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
12openAccesshttp___scitation.aip.org10.1063_1.pdf.jpg2010Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopyRiedel, C.; Arinero, R.; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
13closedAccessaccesoRestringido.pdf.jpg2013Local mechanical and dielectric behavior of the interacting polymer layer in silica nano-particles filled SBR by means of AFM-based methodsKummali, Mohammed M. CSIC; Miccio, Luis A. CSIC ORCID; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCID; Otegui, Jon CSIC; Petzold, Albrecht; Westermann, Stephanartículo
14openAccesse010801.pdf.jpg2010Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopyRiedel, C.; Arinero, R.; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
15closedAccessmay-2010Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative imagesRiedel, C.; Schwartz, Gustavo A. CSIC ORCID; Arinero, R.; Tordjeman, Ph.; Lévêque, G.; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
16closedAccess2011Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samplesRiedel, C.; Alegría, Ángel CSIC ORCID ; Schwartz, Gustavo A. CSIC ORCID; Colmenero de León, Juan CSIC ORCID; Sáenz, J. J.artículo
17openAccess2011On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: A numerical studyRiedel, C.; Alegría, Ángel CSIC ORCID ; Schwartz, Gustavo A. CSIC ORCID; Arinero, R.; Colmenero de León, Juan CSIC ORCID; Sáenz, J. J.artículo
18openAccesshttp___scitation.aip.org10.1063_1.pdf.jpg2011Positron annihilation and relaxation dynamics from dielectric spectroscopy and nuclear magnetic resonance: Cis–trans-1,4-poly(butadiene)Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Arbe, Arantxa CSIC ORCID; Colmenero de León, Juan CSIC ORCIDartículo
19closedAccessabr-2010Positron annihilation response and broadband dielectric spectroscopy: Poly(propylene glycol)Bartoš, Josef; Schwartz, Gustavo A. CSIC ORCID; Alegría, Ángel CSIC ORCID ; Colmenero de León, Juan CSIC ORCIDartículo
20closedAccessaccesoRestringido.pdf.jpg2006Pressure−temperature dependence of polymer segmental dynamics. Comparison between the Adam−Gibbs approach and density scalingsSchwartz, Gustavo A. CSIC ORCID; Colmenero de León, Juan CSIC ORCID; Alegría, Ángel CSIC ORCID artículo