| Derechos | Preview | Fecha Public. | Título | Autor(es) | Tipo |
| openAccess |  | 5-nov-2020 | An insight into the present capabilities of national metrology institutes for measuring sparkle | Ferrero, Alejandro CSIC ORCID; Basic, N.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pastuschek, M.; Perales, E.; Porrovecchio, G.; Šmid, M.; Schirmacher, A.; Velázquez, J.L. CSIC ORCID CVN; Martínez-Verdú, F.M. | artículo |
| openAccess |  | 13-jun-2017 | BRDF variability of typical diffuse reflectance standards between 380 nm and 1700 nm | Ferrero, Alejandro CSIC ORCID; Strothkämper, C.; Bernad, Berta CSIC; Quast, T.; Hauer, K.O.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCID; Schirmacher, A. | póster de congreso |
| openAccess |  | 9-ago-2019 | Deviation of white diffuse reflectance standards from perfect reflecting diffuser at visible and near-infrared spectral ranges | Bernad, Berta CSIC; Ferrero, Alejandro CSIC ORCID; Strothkämper, C.; Campos Acosta, Joaquín CSIC ORCID CVN ; Pons Aglio, Alicia CSIC ORCID; Quast, T.; Hauer, K.O.; Schirmacher, A. | artículo |
| openAccess |  | 22-dic-2020 | Fundamental scattering quantities for the determination of reflectance and transmittance | Ferrero, Alejandro CSIC ORCID; Frisvad, J.R.; Simonot, L.; Santafé, Pablo CSIC ORCID; Schirmacher, A.; Campos Acosta, Joaquín CSIC ORCID CVN ; Hebert, M. | artículo |
| openAccess |  | 1-may-2023 | Intercomparison of bidirectional reflectance distribution function measurements at in- and out-of-plane geometries | Basic, N.; Molloy, E.; Koo, A.; Ferrero, Alejandro CSIC ORCID; Santafé, Pablo CSIC ORCID; Gevaux, L.; Porrovecchio, G.; Schirmacher, A.; Šmíd, M.; Blattner, P.; Hauer, K.-O.; Quast, T.; Campos Acosta, Joaquín CSIC ORCID CVN ; Obein, G. | artículo |
| closedAccess |  | 1-mar-2017 | Multilateral spectral radiance factor scale comparison | Strothkämper, C.; Ferrero, Alejandro CSIC ORCID; Koo, A.; Jaanson, P.; Ged, G.; Obein, G.; Källberg, S.; Audenaert, J.; Leloup, F. B.; Martínez-Verdú, F.M.; Perales, E.; Schirmacher, A.; Campos Acosta, Joaquín CSIC ORCID CVN | artículo |
| openAccess |  | 25-feb-2021 | Preliminary measurement scales for sparkle and graininess | Ferrero, Alejandro CSIC ORCID; Perales, E.; Basic, N.; Pastuschek, M.; Porrovecchio, G.; Schirmacher, A.; Velázquez, J.L. CSIC ORCID CVN; Campos Acosta, Joaquín CSIC ORCID CVN ; Martínez-Verdú, F.M.; Šmid, M.; Linduska, P.; Dauser, T.; Blattner, P. | artículo |
