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DerechosPreviewFecha Public.TítuloAutor(es)Tipo
1openAccessTIM2019.pdf.jpg2020Flexible Setup for the Measurement of CMOS Timedependent Variability with Array-based Integrated CircuitsDíaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Martín-Martínez, Javier; Rodríguez, Rosana; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo
2openAccessnafria_invited_laedc21_final.pdf.jpg19-abr-2021Circuit reliability prediction: Challenges and solutions for the device time-dependent variability characterization roadblockNafria, M.; Diaz-Fortuny, J.; Saraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Martín-Lloret, P. CSIC; Toro-Frias, A. CSIC; Mateo, D.; Barajas, E.; Aragones, X.; Fernández, Francisco V. CSIC ORCIDcomunicación de congreso
3openAccessSMACD22_paper2055_vCamera_Ready_sinISBN.pdf.jpg11-jul-2022On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUFCamacho-Ruiz, Eros CSIC ORCID; Santana-Andreo, A. CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCIDcomunicación de congreso
4openAccessSSE_2019.pdf.jpg2019A smart noise- and RTN-removal method for parameter extraction of CMOS aging compact modelsDíaz-Fortuny, Javier; Martín-Martínez, Javier; Rodriguez, Rosana; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo
5openAccessSMACD2022_NEWMCFvcamera_ready_DIGITAL_CSIC.pdf.jpg11-jul-2022A systematic approach to RTN parameter fitting based on the Maximum Current FluctuationSaraza-Canflanca, P. CSIC ORCID; Martín-Martínez, Javier; Roca, Elisenda CSIC ORCID ; Castro-López, R. CSIC ORCID ; Rodríguez, Rosana; Nafría, Montserrat; Fernández, Francisco V. CSIC ORCIDcomunicación de congreso
6openAccessEXTENDED_final_clean.pdf.jpg2021Unified RTN and BTI statistical compact modeling from a defect-centric perspectivePedreira, G.; Saraza-Canflanca, P. CSIC ORCID; Castro-López, R. CSIC ORCID ; Rodríguez, R.; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo
7openAccessSMACD22_paper7264_vCamera_Ready_sinISBN.pdf.jpg11-jul-2022High-level design of a novel PUF based on RTNCamacho-Ruiz, Eros CSIC ORCID; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCIDcomunicación de congreso
8openAccessSSE_Javier_Diaz_Fortuny_Statistical threshold voltage_FINAL_SUBMITTED.pdf.jpg2021Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditionsDíaz-Fortuny, Javier; Saraza-Canflanca, P. CSIC ORCID; Rodríguez, Rosana; Martín-Martínez, Javier; Castro-López, R. CSIC ORCID ; Roca, Elisenda CSIC ORCID ; Fernández, Francisco V. CSIC ORCID; Nafría, Montserratartículo

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