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Accurate band mapping via photoemission from thin films

AutorMugarza, Aitor ; Marini, Andrea; Strasser, T.; Schattke, W.; Rubio, Angel; García de Abajo, Francisco Javier ; Lobo-Checa, Jorge ; Michel, Enrique G.; Kuntze, J.; Ortega, J. Enrique
Fecha de publicación2004
EditorAmerican Physical Society
CitaciónPhysical Review B 69: 1154221 (2004)
ResumenElectron bands in solids can be determined in angle-resolved photoemission experiments from thin films, where the perpendicular wave vector (k⊥) uncertainty that characterizes photoemission from bulk crystals is removed. However, the comparison with state-of-the-art quasiparticle band-structure calculations has never been done. In this work we have mapped both initial-state (occupied) and final-state (empty) E(k⊥) bands along the A axis of aluminum, from photon-energy- and thickness-dependent quantum-well spectra of aluminum films. For final states the best fit is obtained with inverse low-energy electron diffraction band structure calculations. For initial-state bands of Cu and Al, thin-film data display excellent agreement with bulk quasiparticle theory, suggesting the use of thin films as model systems to investigate fine effects in the crystal band structure.
Versión del editorhttp://dx.doi.org/10.1103/PhysRevB.69.115422
Identificadoresdoi: 10.1103/PhysRevB.69.115422
issn: 1098-0121
e-issn: 1550-235X
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