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Título: | Accurate band mapping via photoemission from thin films |
Autor: | Mugarza, Aitor CSIC ORCID; Marini, Andrea; Strasser, T.; Schattke, W.; Rubio, Angel CSIC ORCID; García de Abajo, Francisco Javier; Lobo-Checa, Jorge CSIC ORCID ; Michel, Enrique G.; Kuntze, J.; Ortega, J. Enrique CSIC ORCID | Fecha de publicación: | 2004 | Editor: | American Physical Society | Citación: | Physical Review B 69: 1154221 (2004) | Resumen: | Electron bands in solids can be determined in angle-resolved photoemission experiments from thin films, where the perpendicular wave vector (k⊥) uncertainty that characterizes photoemission from bulk crystals is removed. However, the comparison with state-of-the-art quasiparticle band-structure calculations has never been done. In this work we have mapped both initial-state (occupied) and final-state (empty) E(k⊥) bands along the A axis of aluminum, from photon-energy- and thickness-dependent quantum-well spectra of aluminum films. For final states the best fit is obtained with inverse low-energy electron diffraction band structure calculations. For initial-state bands of Cu and Al, thin-film data display excellent agreement with bulk quasiparticle theory, suggesting the use of thin films as model systems to investigate fine effects in the crystal band structure. | Versión del editor: | http://dx.doi.org/10.1103/PhysRevB.69.115422 | URI: | http://hdl.handle.net/10261/98098 | DOI: | 10.1103/PhysRevB.69.115422 | Identificadores: | doi: 10.1103/PhysRevB.69.115422 issn: 1098-0121 e-issn: 1550-235X |
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Accurate band mapping.pdf | 326,69 kB | Adobe PDF | Visualizar/Abrir |
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