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Phonon softening and direct to indirect band gap crossover in strained single-layer MoSe2

AutorHorzum, S.; Sahin, H.; Cahangirov, Seymur; Cudazzo, Pierluigi; Rubio, Angel; Serin, T.; Peeters, F. M.
Fecha de publicación2013
EditorAmerican Physical Society
CitaciónPhysical Review B 87: 125415 (2013)
ResumenMotivated by recent experimental observations of Tongay et al. [Nano Lett. 12, 5576 (2012)] we show how the electronic properties and Raman characteristics of single layer MoSe2 are affected by elastic biaxial strain. We found that with increasing strain: (1) the E′ and E′′ Raman peaks (E2g and E1g in bulk) exhibit significant redshifts (up to ∼30 cm−1), (2) the position of the A1′ peak remains at ∼180 cm−1 (A1g in bulk) and does not change considerably with further strain, (3) the dispersion of low energy flexural phonons crosses over from quadratic to linear, and (4) the electronic band structure undergoes a direct to indirect band gap crossover under ∼3% biaxial tensile strain. Thus the application of strain appears to be a promising approach for a rapid and reversible tuning of the electronic, vibrational, and optical properties of single layer MoSe2 and similar MX2 dichalcogenides.
Versión del editorhttp://dx.doi.org/10.1103/PhysRevB.87.125415
URIhttp://hdl.handle.net/10261/95085
DOI10.1103/PhysRevB.87.125415
Identificadoresdoi: 10.1103/PhysRevB.87.125415
issn: 1098-0121
e-issn: 1550-235X
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