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Magnetic scanning probe calibration using graphene hall sensor

AuthorsPanchal, Vishal; Iglesias-Freire, Óscar ; Lartsev, Arseniy; Yakimova, Rositza; Asenjo Barahona, Agustina ; Kazakova, Olga
KeywordsHall sensor
Kelvin probe force microscopy
Magnetic probe calibration
Epitaxial graphene
Issue Date2013
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Transactions on Magnetics 49(7): 3520-3523 (2013)
AbstractMagnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitative measurements. We present a straightforward calibration of B probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined Bprobe ∼ 70 mT and ∼ 76 mT for probes with nominal magnetic moment ∼ 1 × 10-13 and > 3 × 10-13 emu, respectively, at a probe-sample distance of 20 nm. © 2013 IEEE.
Publisher version (URL)http://dx.doi.org/10.1109/TMAG.2013.2243127
Identifiersdoi: 10.1109/TMAG.2013.2243127
issn: 0018-9464
Appears in Collections:(ICMM) Artículos
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