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Electric-field screening in atomically thin layers of MoS2: The role of interlayer coupling

AuthorsCastellanos-Gómez, Andrés ; Cappelluti, E. ; Roldán, Rafael ; Agraït, Nicolás; Guinea, F. ; Rubio-Bollinger, Gabino
Thomas–Fermi theory
Two-dimensional crystals
Electric-field screening
Issue Date2013
CitationAdvanced Materials 25(6): 899-903 (2013)
AbstractThe electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Publisher version (URL)http://dx.doi.org/10.1002/adma.201203731
Identifiersdoi: 10.1002/adma.201203731
issn: 0935-9648
e-issn: 1521-4095
Appears in Collections:(ICMM) Artículos
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