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Título

Laser tests of silicon detectors

Autor Dolezal, Z.; Escobar, Carlos ; Gadomski, S.; García García, Carmen ; González Sevilla, Sergio ; Kodys, P.; Kubik, P.; Lacasta Llácer, Carlos ; Martí García, Salvador ; Mitsou, Vasiliki A. ; Moorhead, G. F.; Phillips, P. W.; Reznicek, P.; Slavik, R.
Palabras clave Semiconductor detectors
Laser tests
[PACS] Solid-state detectors
[PACS] Optical testing techniques
[PACS] Methods of materials testing and analysis
Fecha de publicación 1-abr-2007
EditorElsevier
Citación Nuclear Instruments & Methods in Physics Research Section A - Accelerators, Spectrometers, Detectors and Associated Equipment 573(1-2): 12-15 (2007)
ResumenThis paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented.
Descripción 4 pages, 5 figures.-- PACS nrs.: 29.40.W; 42.87; 81.70.-- ISI Article Identifier: 000245624200005.-- Issue title: Proceedings of the 7th International Conference on Position-Sensitive Detectors - PSD-7, 7th International Conference on Position-Sensitive Detectors.
Available online 29 November 2006.
Versión del editorhttp://dx.doi.org/10.1016/j.nima.2006.10.319
URI http://hdl.handle.net/10261/9127
DOI10.1016/j.nima.2006.10.319
ISSN0168-9002
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