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Título: | Imprinting the optical near field of microstructures with nanometer resolution |
Autor: | Kühler, Paul CSIC; García de Abajo, Francisco Javier; Solís Céspedes, Javier CSIC ORCID ; Mosbacher, M.; Leiderer, Paul; Afonso, Carmen N. CSIC ; Siegel, Jan CSIC ORCID | Palabras clave: | Data storage Nanoparticles Nanopatterning Chalcogenides |
Fecha de publicación: | 2009 | Editor: | Wiley-VCH | Citación: | Small 5: 1825-1829 (2009) | Resumen: | An experimental method to directly image with nanometer spatial resolution complex 2D near-field intensity distributions underneath the scattering particle by imprinting a 2D pattern in thin photosensitive films, was demonstrated. The sputter-deposited samples consisted of 40-nm-thick, face-centered-cubic polycrystalline Ge2Sb2Te5 films on Si [001] wafers covered by a 10-nm-thick amorphous SiO2 buffer Layer. Spherical silica particles with a polydispersity of <10% in diameter, a measured refractive index of 1.44 at 589 nm, stored in isopropanol, were deposited on the substrate by means of spin coating. Laser irradiation was performed in air using a regeneratively amplified Ti:sapphire laser system. The sample was mounted on a movable table and observed in situ with a home-built microscope based on a microscope objective and a tube lens, equipped with a 12 bit charge-coupled device (CCD) camera. The light polarization is found to have a strong influence on the imprinted pattern. © 2009 Wiley-VCH Verlag GmbH & Co. | URI: | http://hdl.handle.net/10261/88796 | DOI: | 10.1002/smll.200900393 | Identificadores: | doi: 10.1002/smll.200900393 issn: 1613-6810 |
Aparece en las colecciones: | (CFMAC-IO) Artículos |
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