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Electron scattering data to model electron tracks in gases: application to ethylene and sulfur hexafluoride

AuthorsFuss, Martina ; Blanco, F.; Muñoz, A. ; Oller, J.C.; Almeida, D.; Limão-Vieira, Paulo; Do, T.P.T.; Brunger, M.J.; Buckman, S.J.; García, Gustavo
Issue Date5-Feb-2012
PublisherCSIC - Instituto de Física Fundamental (IFF)
CitationGEM XVII Conference 2012
DescriptionGEM XVII Conference 5 th -8th February 2012
Appears in Collections:(CFMAC-IFF) Comunicaciones congresos
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