English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/87076
Share/Impact:
Statistics
logo share SHARE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Title

A BIST solution for the functional characterization of RF systems based on envelope response analysis

AuthorsBarragán, Manuel J. ; Fiorelli, R. ; Vázquez, Diego ; Rueda, Adoración ; Huertas-Díaz, J. L.
Issue Date2009
PublisherInstitute of Electrical and Electronics Engineers
CitationAsian Test Symposium: 255-260 (2009)
AbstractThis paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach.
DescriptionTrabajo presentado al ATS celebrado en Taichung (Taiwan) del 23 al 26 de noviembre de 2009.
Publisher version (URL)http://dx.doi.org/10.1109/ATS.2009.14
URIhttp://hdl.handle.net/10261/87076
DOI10.1109/ATS.2009.14
Identifiersdoi: 10.1109/ATS.2009.14
isbn: 978-0-7695-3864-8
Appears in Collections:(IMSE-CNM) Libros y partes de libros
Files in This Item:
File Description SizeFormat 
A BIST Solution.pdf222,94 kBAdobe PDFThumbnail
View/Open
Show full item record
 

Related articles:


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.