English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/85672
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:


A low-cost digital frequency testing approach for mixed-signal devices using ΣΔ modulation

AuthorsPrenat, G.; Mir, S.; Vázquez, Diego ; Rolíndez, Luís
Issue Date2005
CitationMicroelectronics Journal 36(12): 1080-1090 (2005)
AbstractThis paper presents a digital approach to frequency testing of Analogue and mixed-signal (AMS) circuits. This approach is aimed at facilitating low-cost test techniques for system-on-chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a sigma-delta (ΣΔ) encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and ΣΔ modulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between fault and yield coverage. A 0.18 μm CMOS implementation of this BIST technique is presented, including some experimental results. © 2005 Elsevier Ltd. All rights reserved.
Identifiersdoi: 10.1016/j.mejo.2005.04.062
issn: 0026-2692
Appears in Collections:(IMSE-CNM) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
Show full item record
Review this work

Related articles:

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.