English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/85647
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE
Exportar a otros formatos:


Current mode techniques for sub-pico-ampere circuit design

AuthorsLinares-Barranco, Bernabé ; Serrano-Gotarredona, Teresa ; Serrano-Gotarredona, Rafael; Serrano-Gotarredona, Clara
Issue Date2004
CitationAnalog Integrated Circuits and Signal Processing 38(2-3): 103-119 (2004)
AbstractIn this paper we explore the low current limit that standard CMOS technologies offer for current mode based VLSI designs. We show and validate a reliable circuit design technique for current mode signal processing down to fempto-amperes. We will take advantage of specific-current extractors and logarithmic current splitters to obtain on-chip sub-pA currents. Then we will use a special on-chip saw-tooth oscillator to monitor and measure currents down to a few fempto-amps. This way, sub-pA currents are characterized without driving them off-chip, nor requiring expensive instrumentation with complicated low leakage setups. A special current mirror is also introduced for reliably replicating such low currents. As an example, a simple log-domain first-order low-pass filter is implemented that uses a 100 fF capacitor and a 3.5 fA bias current to achieve a cut-off frequency of 0.5 Hz and using an area of 12 × 24.35 μm2 in a standard 0.35 μm CMOS process. A technique for characterizing noise at these currents is described and verified. Also, temperature dependence of leakage currents is measured as well.
Identifiersdoi: 10.1023/B:ALOG.0000011162.52504.39
issn: 0925-1030
e-issn: 1573-1979
Appears in Collections:(IMSE-CNM) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
Show full item record
Review this work

WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.