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Characterization of corrosion products on chalcographic copper plates after 200 years' exposure to indoor atmospheres

AuthorsOtero, Eduardo; Bastidas Rull, José María; López, W.; García Fierro, José Luis
Issue Date1994
PublisherJohn Wiley & Sons
CitationMaterials and Corrosion - Werkstoffe und Korrosion 45: 387-391 (1994)
AbstractThis work studies the characterization of corrosion products formed on six eighteenth century chalcographic copper plates preserved in the National Chalcography Collection in the San Fernando Royal Academy of Fine Arts in Madrid. The experimental methods used were X-ray diffraction analysis (XRDA). Infrared spectroscopy (IRS). Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). The main compounds found were malachite CuCO3 · Cu(OH)2, atacamite CuCl2·3Cu(OH)2, nantokite CuCl, tenorite CuO, and cuprite Cu2O. Cuprite is the main compound found on the smooth areas of chalcographic plates, forming tarnish films. The thickness of the tarnish films is approximately 10-15 angstrom.
Identifiersdoi: 10.1002/maco.19940450704
issn: 0043-2822
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