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A high-Q bandpass fully differential SC filter with enhanced testability

AuthorsVázquez, Diego ; Rueda, Adoración ; Huertas-Díaz, J. L. ; Peralías, E.
Issue Date1998
PublisherInstitute of Electrical and Electronics Engineers
CitationIEEE Journal of Solid-State Circuits 33(7): 976-986 (1998)
AbstractThis paper presents a low-cost testing approach for switched-capacitor filters. A design for testability (DfT) methodology is discussed, and a system-level architecture is proposed providing capabilities for an off- and on-line test as well as a builtin self-test (BIST). To prove the feasibility of this approach, it has been applied to a sixth-order high-Q bandpass switched-capacitor (SC) filter. The benefit is a significant testability enhancement without degrading filter behavior. Experimental results from a silicon prototype are also presented.
Identifiersdoi: 10.1109/4.701236
issn: 0018-9200
Appears in Collections:(IMSE-CNM) Artículos
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