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dc.contributor.author | Aizpurua, Javier | - |
dc.contributor.author | Taubner, Thomas | - |
dc.contributor.author | García de Abajo, Francisco Javier | - |
dc.contributor.author | Brehm, Markus | - |
dc.contributor.author | Hillenbrand, Rainer | - |
dc.date.accessioned | 2008-11-12T11:47:42Z | - |
dc.date.available | 2008-11-12T11:47:42Z | - |
dc.date.issued | 2008-01-22 | - |
dc.identifier.citation | Optics Express 16(3): 1529-1545 (2008) | en_US |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | http://hdl.handle.net/10261/8472 | - |
dc.description | 17 pages, 8 figures.-- OCIS codes: 240.6490, 300.6340, 180.4243, 290.5825.-- © 2008 Optical Society of America. | en_US |
dc.description.abstract | We study the amplitude and phase signals detected in infrared scattering-type near field optical microscopy (s-SNOM) when probing a thin sample layer on a substrate. We theoretically describe this situation by solving the electromagnetic scattering of a dipole near a planar sample consisting of a substrate covered by thin layers. We perform calculations to describe the effect of both weakly (Si and SiO2) and strongly (Au) reflecting substrates on the spectral s-SNOM signal of a thin PMMA layer. We theoretically predict, and experimentally confirm an enhancement effect in the polymer vibrational spectrum when placed on strongly reflecting substrates. We also calculate the scattered fields for a resonant tip-substrate interaction, obtaining a dramatic enhancement of the signal amplitude and spectroscopic contrast of the sample layer, together with a change of the spectral line shape. The enhanced contrast opens the possibility to perform ultra-sensitive near field infrared spectroscopy of monolayers and biomolecules. | en_US |
dc.description.sponsorship | We wish to acknowledge financial support from the Department of Industry of the Basque Country (ETORTEK project NANOTRON), from Gipuzkoa Foru Aldundia (nanoGUNE), from the Spanish MEC (NAN2004-08843-C05- 05 and MAT2007-66050), from BMBF grant no. 03N8705, and from the Bavarian California Technology Center (BaCaTec). T.T. was supported by a fellowship within the Postdoc-Programme of the German Academic Exchange Service (DAAD). | en_US |
dc.format.extent | 425425 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | en_US |
dc.publisher | Optical Society of America | en_US |
dc.rights | openAccess | en_US |
dc.subject | [OCIS] Optics at surfaces: Spectroscopy, surface | en_US |
dc.subject | [OCIS] Spectroscopy: Spectroscopy, infrared | en_US |
dc.subject | [OCIS] Microscopy: Near-field microscopy | en_US |
dc.subject | [OCIS] Scattering: Scattering theory | en_US |
dc.title | Substrate-enhanced infrared near-field spectroscopy | en_US |
dc.type | artículo | en_US |
dc.identifier.doi | 10.1364/OE.16.001529 | - |
dc.description.peerreviewed | Peer reviewed | en_US |
dc.relation.publisherversion | http://dx.doi.org/10.1364/OE.16.001529 | en_US |
dc.type.coar | http://purl.org/coar/resource_type/c_6501 | es_ES |
item.openairetype | artículo | - |
item.grantfulltext | open | - |
item.cerifentitytype | Publications | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.fulltext | With Fulltext | - |
item.languageiso639-1 | en | - |
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