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dc.contributor.authorAizpurua, Javier-
dc.contributor.authorTaubner, Thomas-
dc.contributor.authorGarcía de Abajo, Francisco Javier-
dc.contributor.authorBrehm, Markus-
dc.contributor.authorHillenbrand, Rainer-
dc.date.accessioned2008-11-12T11:47:42Z-
dc.date.available2008-11-12T11:47:42Z-
dc.date.issued2008-01-22-
dc.identifier.citationOptics Express 16(3): 1529-1545 (2008)en_US
dc.identifier.issn1094-4087-
dc.identifier.urihttp://hdl.handle.net/10261/8472-
dc.description17 pages, 8 figures.-- OCIS codes: 240.6490, 300.6340, 180.4243, 290.5825.-- © 2008 Optical Society of America.en_US
dc.description.abstractWe study the amplitude and phase signals detected in infrared scattering-type near field optical microscopy (s-SNOM) when probing a thin sample layer on a substrate. We theoretically describe this situation by solving the electromagnetic scattering of a dipole near a planar sample consisting of a substrate covered by thin layers. We perform calculations to describe the effect of both weakly (Si and SiO2) and strongly (Au) reflecting substrates on the spectral s-SNOM signal of a thin PMMA layer. We theoretically predict, and experimentally confirm an enhancement effect in the polymer vibrational spectrum when placed on strongly reflecting substrates. We also calculate the scattered fields for a resonant tip-substrate interaction, obtaining a dramatic enhancement of the signal amplitude and spectroscopic contrast of the sample layer, together with a change of the spectral line shape. The enhanced contrast opens the possibility to perform ultra-sensitive near field infrared spectroscopy of monolayers and biomolecules.en_US
dc.description.sponsorshipWe wish to acknowledge financial support from the Department of Industry of the Basque Country (ETORTEK project NANOTRON), from Gipuzkoa Foru Aldundia (nanoGUNE), from the Spanish MEC (NAN2004-08843-C05- 05 and MAT2007-66050), from BMBF grant no. 03N8705, and from the Bavarian California Technology Center (BaCaTec). T.T. was supported by a fellowship within the Postdoc-Programme of the German Academic Exchange Service (DAAD).en_US
dc.format.extent425425 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoengen_US
dc.publisherOptical Society of Americaen_US
dc.rightsopenAccessen_US
dc.subject[OCIS] Optics at surfaces: Spectroscopy, surfaceen_US
dc.subject[OCIS] Spectroscopy: Spectroscopy, infrareden_US
dc.subject[OCIS] Microscopy: Near-field microscopyen_US
dc.subject[OCIS] Scattering: Scattering theoryen_US
dc.titleSubstrate-enhanced infrared near-field spectroscopyen_US
dc.typeartículoen_US
dc.identifier.doihttp://dx.doi.org/10.1364/OE.16.001529-
dc.description.peerreviewedPeer revieweden_US
dc.relation.publisherversionhttp://dx.doi.org/10.1364/OE.16.001529en_US
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