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Título : Dependence of the fundamental frequencies of T. E. piezoelectric transducers on intrinsic losses and external loading
Autor : San Emeterio, José Luis; Ramos, Antonio
Palabras clave : Broadband ultrasonic transducers
Thickness extensional (T.E.) piezoelectric resonators
Characterization
Electrical impedance curves
Fundamental resonance frequencies
Dependencies
Fecha de publicación : sep-2002
Editor: Sociedad Española de Acústica
Citación : Forum Acusticum Sevilla 2002. Ultrasonics ; ULT-04-007-IP
Resumen: Thickness extensional (T.E.) piezoelectric elements are the base of many broadband ultrasonic transducers for imaging and detection applications. The measurement of their electrical impedance as a function of frequency, using an impedance analyser, is the usual technique to evaluate piezoelectric transducer material properties as well as to analyse the characteristics of multilayer broadband transducers. Intrinsic mechanical, dielectric and piezoelectric losses, in addition with external mechanical loading (backing, matching, medium) modify the fundamental resonance (fn, fs, fr), and antiresonance (fa, fp, fm ) frequencies. On the other hand, the peak frequencies of the emission, reception and pulse-echo ultrasonic working bands depend on these same aspects but they are also dependent on the external E/R electrical loading. In this paper, some of these dependencies of the fundamental frequencies are described and analysed by means of an accurate transmission line model.
Descripción : 6 pages, 3 figures.-- PACS nr.: 43.38.Fx.-- Communication presented at: Forum Acusticum Sevilla 2002 (Sevilla, Spain, 16-20 Sep 2002), comprising: 3rd European Congress on Acoustics; XXXIII Spanish Congress on Acoustics (TecniAcústica 2002); European and Japanese Symposium on Acoustics; 3rd Iberian Congress on Acoustics.-- Special issue of the journal Revista de Acústica, Vol. XXXIII, year 2002.
URI : http://hdl.handle.net/10261/8000
ISBN : 84-87985-07-6
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