Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/78086
Share/Export:
logo share SHARE logo core CORE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invite to open peer review
DC FieldValueLanguage
dc.contributor.authorCabibbo, M.-
dc.contributor.authorRicci, P.-
dc.contributor.authorCecchini, R.-
dc.contributor.authorRymuza, Z.-
dc.contributor.authorSullivan, J.-
dc.contributor.authorDub, S.-
dc.contributor.authorCohen, S.-
dc.date.accessioned2013-06-13T09:55:37Z-
dc.date.available2013-06-13T09:55:37Z-
dc.date.issued2012-02-
dc.identifier.citationMicron 43 (2–3): 215–222 (2012)es_ES
dc.identifier.issn0968-4328-
dc.identifier.urihttp://hdl.handle.net/10261/78086-
dc.description8 páginas, 5 figurases_ES
dc.description.abstractNanoindentation has become a common technique for measuring the hardness and elastic–plastic properties of materials, including coatings and thin films. In recent years, different nanoindenter instruments have been commercialised and used for this purpose. Each instrument is equipped with its own analysis software for the derivation of the hardness and reduced Young's modulus from the raw data. These data are mostly analysed through the Oliver and Pharr method. In all cases, the calibration of compliance and area function is mandatory. The present work illustrates and describes a calibration procedure and an approach to raw data analysis carried out for six different nanoindentation instruments through several round-robin experiments. Three different indenters were used, Berkovich, cube corner, spherical, and three standardised reference samples were chosen, hard fused quartz, soft polycarbonate, and sapphire. It was clearly shown that the use of these common procedures consistently limited the hardness and reduced the Young's modulus data spread compared to the same measurements performed using instrument-specific procedures. The following recommendations for nanoindentation calibration must be followed: (a) use only sharp indenters, (b) set an upper cut-off value for the penetration depth below which measurements must be considered unreliable, (c) perform nanoindentation measurements with limited thermal drift, (d) ensure that the load–displacement curves are as smooth as possible, (e) perform stiffness measurements specific to each instrument/indenter couple, (f) use Fq and Sa as calibration reference samples for stiffness and area function determination, (g) use a function, rather than a single value, for the stiffness and (h) adopt a unique protocol and software for raw data analysis in order to limit the data spread related to the instruments (i.e. the level of drift or noise, defects of a given probe) and to make the H and Er data intercomparable.es_ES
dc.description.sponsorshipThis work was carried out within the framework of the FP7-funded NANOINDENT (NMP3-CA-2008-218659) project entitled Creating and disseminating novel nanomechanical characterisation techniques and standards. All the authors acknowledge the European Commission for having funded this research activity. The authors also wish to thank Dr. Thomas Chudoba, ASMEC, for allowing the use of their data and for the fruitful discussions.es_ES
dc.language.isoenges_ES
dc.publisherElsevieres_ES
dc.rightsopenAccesses_ES
dc.subjectNanoindentationes_ES
dc.subjectCalibrationes_ES
dc.subjectRound-robines_ES
dc.subjectHardnesses_ES
dc.subjectYoung's moduluses_ES
dc.titleAn international round-robin calibration protocol for nanoindentation measurementses_ES
dc.typeartículoes_ES
dc.identifier.doi10.1016/j.micron.2011.07.016-
dc.description.peerreviewedPeer reviewedes_ES
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.micron.2011.07.016es_ES
dc.type.coarhttp://purl.org/coar/resource_type/c_6501es_ES
item.openairetypeartículo-
item.fulltextWith Fulltext-
item.grantfulltextopen-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
Appears in Collections:(ICMS) Artículos
Files in This Item:
File Description SizeFormat
Micron volume 43, issues 2–3, February 2012, pages 215–222.docx435,92 kBMicrosoft Word XMLView/Open
Show simple item record

CORE Recommender

SCOPUSTM   
Citations

48
checked on May 25, 2024

WEB OF SCIENCETM
Citations

45
checked on Feb 28, 2024

Page view(s)

418
checked on May 28, 2024

Download(s)

284
checked on May 28, 2024

Google ScholarTM

Check

Altmetric

Altmetric


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.