Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/77311
COMPARTIR / EXPORTAR:
logo share SHARE logo core CORE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invitar a revisión por pares abierta
Título

Cold crystallization of poly(ethylene naphthalene-2,6-dicarboxylate) by simultaneous measurements of X-ray scattering and dielectric spectroscopy

AutorSics, Igors; Ezquerra, Tiberio A. CSIC ORCID; Nogales, Aurora CSIC ORCID; Denchev, Zlatan; Álvarez, C.; Funari, Sergio S.
Fecha de publicación2003
EditorElsevier
CitaciónPolymer 44: 1045- 1049 (2003)
ResumenThe isothermal cold crystallization of poly(ethylene naphthalene-2,6-dicarboxylate) was investigated by simultaneous small and wide angle X-ray scattering and dielectric spectroscopy (DS). By this experimental approach, simultaneously collected information was obtained about the specific changes occurring in both crystalline and amorphous phases during crystallization, namely about the chain ordering through wide angle X-ray scattering, about the lamellar crystals arrangement by means of small angle X-ray scattering, and about the amorphous phase evolution by means of DS. The results indicate that average mobility of the amorphous phase suffers a discontinuous decrease upon passing from the primary to the secondary crystallization regime. We interpret these results assuming that the restriction to the mobility of the amorphous phase occurs mainly in the amorphous regions between the lamellar stacks and not in the amorphous regions within the lamellar stacks. © 2002 Elsevier Science Ltd. All rights reserved.
URIhttp://hdl.handle.net/10261/77311
DOI10.1016/S0032-3861(02)00742-5
Identificadoresdoi: 10.1016/S0032-3861(02)00742-5
issn: 0032-3861
Aparece en las colecciones: (CFMAC-IEM) Artículos




Ficheros en este ítem:
Fichero Descripción Tamaño Formato
accesoRestringido.pdf14,72 kBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo

CORE Recommender

SCOPUSTM   
Citations

24
checked on 22-abr-2024

WEB OF SCIENCETM
Citations

26
checked on 26-feb-2024

Page view(s)

327
checked on 24-abr-2024

Download(s)

100
checked on 24-abr-2024

Google ScholarTM

Check

Altmetric

Altmetric


NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.