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Surface characterisation of cerium-doped silica coatings obtained by sol-gel

AuthorsCano Díaz, Emilio ; García, M. A.; Villegas Broncano, María Ángeles ; Llopis, J.; Battaglin, G.; Bastidas Rull, José María
Issue Date2003
CitationJournal of Sol-Gel Science and Technology 27: 293-299 (2003)
AbstractThe chemical composition of cerium-doped silica coatings prepared via sol-gel were studied using X-ray photoelectron spectroscopy (XPS) in conjunction with Ar+-ion sputtering, Rutherford back-scattering spectroscopy (RBS) and photoluminescence (PL) spectroscopy. XPS results showed that cerium was incorporated in the silica network as Ce(III). The absence of PL emissions from Ce(III) was explained by a clustering of the ions producing a quenching of the luminescence. XPS combined with Ar+ and RBS showed that the distribution of Ce is not uniform across the coating, showing a maximum concentration in an inner layer of the coating.
Identifiersdoi: 10.1023/A:1024064818846
issn: 0928-0707
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