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Thickness dependence of critical temperature in Mo/Au bilayers

AuthorsParra-Borderías, María ; Fernández-Martínez, Iván ; Fàbrega, Lourdes ; Camón, Agustín; Gil García, Óscar ; Costa Krämer, José Luis ; González-Arrabal, Raquel ; Sesé Monclús, Javier ; Briones Fernández-Pola, Fernando
Issue Date2011
CitationEUCAS 2011
AbstractWe report on the sensitivity of the superconducting critical temperature (TC) to layer thickness, as well as on TC reproducibility in Mo/Au bilayers. Resistivity measurements on samples with a fixed Au thickness (dAu) and Mo thickness (dMo) ranging from 50 to 250 nm, and with a fixed dMo and different dAu thickness are shown. Experimental data are discussed in the framework of Martinis model, whose application to samples with dAu above their coherence length is analysed in detail. Results show a good coupling between normal and superconducting layers and excellent TC reproducibility, allowing to accurately correlate Mo layer thickness and bilayer TC.
DescriptionTrabajo presentado a la: "European Conference on Applied Superconductivity (EUCAS)" celebrada del 18 al 23 de septiembre de 2011 en Holanda.
Publisher version (URL)http://www.eucas2011.org/index.php
Appears in Collections:(IMN-CNM) Comunicaciones congresos
(ICMA) Comunicaciones congresos
(ICMAB) Comunicaciones congresos
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