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dc.contributor.authorMolero Armenta, Miguel Ángel-
dc.contributor.authorIzquierdo, M. A. G.-
dc.contributor.authorHernández, M. G.-
dc.contributor.authorAnaya Velayos, José Javier-
dc.contributor.authorSánchez Martín, Teresa-
dc.identifier.govdocSociedad Española de Acústica (SEA-
dc.identifier.otherXIX Congreso Internacional de Acústica (ICA2007)-
dc.descriptionPonencia presentada en el XIX Congreso Internacional de Acústica (ICA2007), Madrid, 2-7 Sep 2007.-- PACS: 43.60.Hjen_US
dc.description.abstractIn ultrasonic non-destructive evaluation of highly scattering materials, detection of flaw echoes is difficult due to the masking effects of the structural noise. This paper presents a method for the reduction of the structural noise on highly scattering aterials. The method consists of a multi-resolution analysis using wavelets and a time-frequency thresholding applied to the approximation coefficients. This threshold is estimated by considering the mean and the standard deviation of the time-frequency energy representation. This method exploits spectral properties of the structural noise and the incoming flaw signal, resulting in a processed signal that maintains the defect pulse shape. In order to validate this strategy, synthetic and experimental signals have been evaluated. The performance of this method is compared with known selection rules as Minimax and Universal threshold.en_US
dc.description.sponsorshipThe authors would like to thank the financial support of Spanish Ministry of Science and Education with project DHORAVE BIA2006-15188-C03-01. M Molero is supported by the Programme Alban, the European Union programme of high level Scholarship for Latin America (E05D055458MX) and The Mexican National Council for Science and Technology Conacyt: (186384). M.G. Hernández is supported by a postdoctoral CSIC-I3P contract granted by the European Social Fund.en_US
dc.format.extent304706 bytes-
dc.subjectflaw detectionen_US
dc.subjectstructural noiseen_US
dc.subjecttime-frequency thresholdingen_US
dc.titleFlaw detection on highly scattering materials using multiresolution analysis with time-frequency thresholdingen_US
dc.typecomunicación de congresoen_US
item.openairetypecomunicación de congreso-
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