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Flaw detection on highly scattering materials using multiresolution analysis with time-frequency thresholding

AuthorsMolero Armenta, Miguel Ángel; Izquierdo, M. A. G.; Hernández, M. G.; Anaya Velayos, José Javier; Sánchez Martín, Teresa
Keywordsflaw detection
structural noise
time-frequency thresholding
Issue Date9-Oct-2008
AbstractIn ultrasonic non-destructive evaluation of highly scattering materials, detection of flaw echoes is difficult due to the masking effects of the structural noise. This paper presents a method for the reduction of the structural noise on highly scattering aterials. The method consists of a multi-resolution analysis using wavelets and a time-frequency thresholding applied to the approximation coefficients. This threshold is estimated by considering the mean and the standard deviation of the time-frequency energy representation. This method exploits spectral properties of the structural noise and the incoming flaw signal, resulting in a processed signal that maintains the defect pulse shape. In order to validate this strategy, synthetic and experimental signals have been evaluated. The performance of this method is compared with known selection rules as Minimax and Universal threshold.
DescriptionPonencia presentada en el XIX Congreso Internacional de Acústica (ICA2007), Madrid, 2-7 Sep 2007.-- PACS: 43.60.Hj
Publisher version (URL)
Gov't Doc #Sociedad Española de Acústica (SEA
Appears in Collections:(IAI) Comunicaciones congresos

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