English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/74890
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:
Title

Growth and characterization of nitrogen-doped TiO2 thin films prepared by reactive pulsed laser deposition

AuthorsSauthier, Guillaume ; Ferrer, F. J. ; Figueras, Albert; Gyorgy, Eniko
Issue Date2010
PublisherElsevier
CitationThin Solid Films 519(4): 1464-1469 (2010)
AbstractNitrogen-doped titanium dioxide (TiO2) thin films were grown on (001) SiO2 substrates by reactive pulsed laser deposition. A KrF* excimer laser source (λ = 248 nm, τFWHM ≅ 10 ns, ν = 10 Hz) was used for the irradiations of pressed powder targets composed by both anatase and rutile phase TiO2. The experiments were performed in a controlled reactive atmosphere consisting of oxygen or mixtures of oxygen and nitrogen gases. The obtained thin film crystal structure was investigated by X-ray diffraction, while their chemical composition as well as chemical bonding states between the elements were studied by X-ray photoelectron spectroscopy. An interrelation was found between nitrogen concentration, crystalline structure, bonding states between the elements, and the formation of titanium oxinitride compounds. Moreover, as a result of the nitrogen incorporation in the films a continuous red-shift of the optical absorption edge accompanied by absorption in the visible spectral range between 400 and 500 nm wavelength was observed. © 2010 Elsevier B.V. All rights reserved.
URIhttp://hdl.handle.net/10261/74890
DOI10.1016/j.tsf.2010.09.043
Identifiersdoi: 10.1016/j.tsf.2010.09.043
issn: 0040-6090
Appears in Collections:(CIN2) Artículos
(CNA) Artículos
Files in This Item:
File Description SizeFormat 
accesoRestringido.pdf15,38 kBAdobe PDFThumbnail
View/Open
Show full item record
Review this work
 

Related articles:


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.