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Growth, structural, and magnetic characterization of epitaxial Co2MnSi films deposited on MgO and Cr seed layers

AuthorsOrtiz, G.; García-García, A.; Biziere, N.; Boust, F.; Bobo, J. F.; Snoeck, E.
Issue Date2013
PublisherAmerican Institute of Physics
CitationJournal of Applied Physics 113(4): 043921 (2013)
AbstractWe report detailed structural characterization and magneto-optical Kerr magnetometry measurements at room temperature in epitaxial Co2MnSi thin films grown on MgO(001) and Cr(001) buffered MgO single crystals prepared by sputtering. While Co2MnSi/Cr//MgO(001) films display the expected cubic anisotropy, the magnetization curves obtained for Co2MnSi// MgO(001) samples exhibit a superimposed in-plane uniaxial magnetic anisotropy. The evolution of magnetization with film thickness points to a relevant interfacial Co2MnSi-buffer layer (Cr or MgO) contribution which competes with magnetic properties of bulk Co2MnSi, resulting in a drastic change in the magnetism of the whole sample. The origin of this interfacial magnetic anisotropy is discussed and correlated with our structural studies. © 2013 American Institute of Physics.
Publisher version (URL)http://dx.doi.org/10.1063/1.4789801
Identifiersdoi: 10.1063/1.4789801
issn: 0021-8979
e-issn: 1089-7550
Appears in Collections:(ICMA) Artículos
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