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dc.contributor.authorAfonso, Carmen N.-
dc.contributor.authorBallesteros, J. M.-
dc.contributor.authorGonzalo de los Reyes, José-
dc.contributor.authorRighini, G.C.-
dc.contributor.authorPelli, S.-
dc.date.accessioned2012-10-10T10:39:13Z-
dc.date.available2012-10-10T10:39:13Z-
dc.date.issued1996-
dc.identifierdoi: 10.1016/0169-4332(95)00550-1-
dc.identifierissn: 0169-4332-
dc.identifier.citationApplied Surface Science 96-98: 760- 763 (1996)-
dc.identifier.urihttp://hdl.handle.net/10261/57758-
dc.description.abstractRare-earth (Er,Yb) doped glass films are prepared by pulsed laser deposition onto different substrates: Si, fused quartz and Si with a silicon oxide buffer layer. Films grown in the presence of an oxygen pressure higher than 6 × 10-2 mbar have a refractive index close and slightly higher than that of the bulk material thus proving that the density of the films is high. Films thicker than 1 μm are multimode waveguides with a refractive index of 1.562 ± 0.003 and show losses higher than 10 dB/cm which seem to be related to surface roughness due both to the substrate quality and the deposition process.-
dc.description.sponsorshipPart of this work has been done in the frame of the CSIC-CNR agreement. -
dc.language.isoeng-
dc.publisherElsevier-
dc.rightsclosedAccess-
dc.titleRare-earth doped glass waveguides prepared by pulsed laser deposition-
dc.typeartículo-
dc.identifier.doi10.1016/0169-4332(95)00550-1-
dc.date.updated2012-10-10T10:39:13Z-
dc.description.versionPeer Reviewed-
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