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Title

Global search in photoelectron diffraction structure determination using genetic algorithms

AuthorsViana, M. L.; Díez Muiño, Ricardo
Issue Date2007
PublisherInstitute of Physics Publishing
CitationJournal of Physics Condensed Matter 19(44): 446002 (2007)
AbstractPhotoelectron diffraction (PED) is an experimental technique widely used to perform structural determinations of solid surfaces. Similarly to low-energy electron diffraction (LEED), structural determination by PED requires a fitting procedure between the experimental intensities and theoretical results obtained through simulations. Multiple scattering has been shown to be an effective approach for making such simulations. The quality of the fit can be quantified through the so-called R-factor. Therefore, the fitting procedure is, indeed, an R-factor minimization problem. However, the topography of the R-factor as a function of the structural and non-structural surface parameters to be determined is complex, and the task of finding the global minimum becomes tough, particularly for complex structures in which many parameters have to be adjusted. In this work we investigate the applicability of the genetic algorithm (GA) global optimization method to this problem. The GA is based on the evolution of species, and makes use of concepts such as crossover, elitism and mutation to perform the search. We show results of its application in the structural determination of three different systems: the Cu(111) surface through the use of energy-scanned experimental curves; the Ag(110)-c(2 × 2)-Sb system, in which a theory-theory fit was performed; and the Ag(111) surface for which angle-scanned experimental curves were used. We conclude that the GA is a highly efficient method to search for global minima in the optimization of the parameters that best fit the experimental photoelectron diffraction intensities to the theoretical ones. © IOP Publishing Ltd.
URIhttp://hdl.handle.net/10261/53521
DOI10.1088/0953-8984/19/44/446002
Identifiersdoi: 10.1088/0953-8984/19/44/446002
issn: 0953-8984
e-issn: 1361-648X
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