English   español  
Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/52548
Compartir / Impacto:
Add this article to your Mendeley library MendeleyBASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL

Deformation, contact time, and phase contrast in tapping mode scanning force microscopy

AutorTamayo de Miguel, Francisco Javier ; García García, Ricardo
Fecha de publicación1996
EditorAmerican Chemical Society
CitaciónLangmuir : the ACS journal of surfaces and colloids 12: 4430-4435 (1996)
ResumenThe general features of tapping mode operation of a scanning force microscope are presented. Relevant factors of tapping mode such as forces, deformation, and contact times can be calculated as functions of tapping frequency, amplitude damping, and sample elastic and viscoelastic properties. Typical contact times per oscillation are about 10-7 s for hard samples and 6 × 10-7 s for soft materials, i.e., between one and two orders of magnitude smaller than their equivalents in contact mode force microscopy. The model proposed allows the determination of the phase lag between excitation signal and cantilever response. Major factors to phase contrast are viscoelastic properties and adhesion forces with little participation from elastic properties. Experiments performed on droplets of glycerin deposited on graphite illustrate the ability to image them by recording phase changes.
Identificadoresdoi: 10.1021/la960189l
issn: 0743-7463
Aparece en las colecciones: (IMN-CNM) Artículos
Ficheros en este ítem:
Fichero Descripción Tamaño Formato  
accesoRestringido.pdf15,38 kBAdobe PDFVista previa
Mostrar el registro completo

Artículos relacionados:

NOTA: Los ítems de Digital.CSIC están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.