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Correlation between the magnetic imaging of cobalt nanoconstrictions and their magnetoresistance response

AutorFernández-Pacheco, Amalio; Serrano-Ramón, Luis; Córdoba, R.; Ibarra, M. Ricardo; Teresa, José María de
Fecha de publicación2012
EditorInstitute of Physics Publishing
CitaciónNanotechnology 23(10): 105703 (2012)
ResumenScanning transmission x-ray microscopy (STXM) and magnetoresistance (MR) measurements are used to investigate the magnetic behavior of a nanoconstriction joining two micrometric electrodes (a pad and a wire). The reversal of the magnetization under variable external static magnetic fields is imaged. By means of a detailed analysis of the STXM images at the nanocontact area, the MR is calculated, based on diffusive anisotropic-MR. This MR agrees well with that obtained from electrical transport measurements, allowing a direct correlation between the MR signal and the magnetic reversal of the system. The magnetization behavior depends on the sample thickness and constriction dimensions. In 40nm-thick samples, with 20×175nm 2 contact areas, the magnetization at the two sides of the constriction forms a net angle of 90°, with a progressive evolution of the magnetization structure between the electrodes during switching. The MR in those cases has a more peaked shape than with 20nm-thick electrodes and 10×80nm 2 contact areas, where the magnetization forms 180°between them, with a wide domain wall pinned at the constriction. As a consequence of this configuration, a plateau in the MR is observed for about 20Oe. © 2012 IOP Publishing Ltd.
Identificadoresdoi: 10.1088/0957-4484/23/10/105703
issn: 0957-4484
e-issn: 1361-6528
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