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CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3

AuthorsVarnakov, S. N.; Bartolomé, Juan; Rubín, Javier; Badía-Romano, L.
Issue Date2011
PublisherTrans Tech Publications
CitationSolid State Phenomena 168-169: 277-280 (2011)
AbstractDetermination of stable phases formed at the Fe/Si interface in (Fe/Si)n structure, grown by thermal evaporation in an ultrahigh vacuum system was performed using conversion electron Mössbauer spectroscopy (CEMS).
Identifiersdoi: 10.4028/www.scientific.net/SSP.168-169.277
issn: 1012-0394
Appears in Collections:(ICMA) Artículos
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