English   español  
Please use this identifier to cite or link to this item: http://hdl.handle.net/10261/52401
Share/Impact:
Statistics
logo share SHARE logo core CORE   Add this article to your Mendeley library MendeleyBASE

Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL
Exportar a otros formatos:

DC FieldValueLanguage
dc.contributor.authorTamayo de Miguel, Francisco Javier-
dc.contributor.authorGarcía García, Ricardo-
dc.date.accessioned2012-06-28T08:32:12Z-
dc.date.available2012-06-28T08:32:12Z-
dc.date.issued1997-
dc.identifierdoi: 10.1063/1.120039-
dc.identifierissn: 0003-6951-
dc.identifier.citationApplied Physics Letters 71: 2394-2396 (1997)-
dc.identifier.urihttp://hdl.handle.net/10261/52401-
dc.description.abstractThe dependence of phase contrast in tapping-mode scanning force microscopy on elastic and inelastic interactions is studied. The cantilever-tip ensemble is simulated as a driven, damped harmonic oscillator. It is found that for tip-sample elastic interactions, phase contrast is independent of the sample's elastic properties. However, phase contrast associated with elastic modulus variations are observed if viscous damping or adhesion energy hysteresis is considered during tip-sample contact. The phase shift versus tip-sample equilibrium separation was measured for a compliant material (polypropylene) and for a stiff sample (mica). The agreement obtained between theory and experiment supports the conclusions derived from the model. These results emphasize the relevance of energy dissipating processes at the nanometer scale to explain phase contrast imaging in tapping-mode force microscopy. © 1997 American Institute of Physics.-
dc.description.sponsorshipDGICYT PB94-0016-
dc.language.isoeng-
dc.publisherAmerican Institute of Physics-
dc.rightsopenAccess-
dc.titleEffects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy-
dc.typeartículo-
dc.identifier.doi10.1063/1.120039-
dc.date.updated2012-06-28T08:32:13Z-
dc.description.versionPeer Reviewed-
Appears in Collections:(IMN-CNM) Artículos
Files in This Item:
File Description SizeFormat 
ApplPhysLett_71_2394.pdf305,66 kBAdobe PDFThumbnail
View/Open
Show simple item record
 

Related articles:


WARNING: Items in Digital.CSIC are protected by copyright, with all rights reserved, unless otherwise indicated.