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Dipolar origin of water etching of amino acid surfaces

AutorSegura, Juan José ; Verdaguer, Albert ; Sacha, G. M.; Fraxedas, J.
Fecha de publicación2011
EditorRoyal Society of Chemistry (Great Britain)
CitaciónPhysical Chemistry Chemical Physics 13: 21446-21450 (2011)
ResumenThe etching induced by water on hydrophobic (001) surfaces of enantiomeric L-, D- and racemic DL-valine crystals has been characterized by means of atomic force microscopy (AFM ) at ambient conditions. Well-defined chiral parallelepipedic shallow patterns, one bilayer deep, are observed for the enantiomeric crystals with sides (steps) oriented along low index crystallographic directions. Hence, chirality can be readily identified by visual inspection of an AFM image after etching . The formation of such regular patterns can be rationalized using basic concepts of electrical dipolar interactions. The key factor that determines the relative etching rate for each step and thus defines the shape of the etching patterns is the orientation of the molecular dipoles with respect to the step edge. The simplicity of the approach allows the prediction of the effect of water etching on other amino acid crystals as well as the effect of the interaction of water with amino acid molecules forming part of more complex structures.
Identificadoresdoi: 10.1039/C1CP22277E
issn: 1463-9076
Aparece en las colecciones: (CIN2) Artículos
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