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Probe microscopy: Images from below the surface

AuthorsGarcía García, Ricardo
Issue Date2010
PublisherNature Publishing Group
CitationNature Nanotechnology 5, 101 - 102 (2010)
AbstractAn atomic force microscope can reveal a range of subsurface information about a sample through mechanical excitation of both the sample and the tip.
DescriptionNews and Views
Publisher version (URL)http://dx.doi.org/10.1038/nnano.2010.14
Appears in Collections:(IMN-CNM) Artículos
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