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Determination and simulation of nanoscale energy dissipation processes in amplitude modulation AFM

AuthorsGómez Castro, Carlos Javier ; García García, Ricardo
KeywordsPhase imaging AFM
Force microscopy
Issue DateMay-2010
CitationUltramicroscopy 111(6): 626–633 (2010)
AbstractWe develop a theoretical framework that explains the use of amplitudemodulationAFM to measure and identify energydissipationprocesses at the nanoscale. The variation of the dissipated energy on a surface by a vibrating tip as a function of its amplitude has a shape that singles out the dissipative process. The method is illustrated by calculating the dynamic-dissipation curves for surface adhesion energy hysteresis, long-range interfacial interactions and viscoelastic processes. We also show that by diving the dissipated energy by its maximum value, the dynamic-dissipation curves become independent of the experimental parameters. In particular, for long-range dissipative processes we have derived an analytical relationship that shows the independence of the normalized dynamic-dissipation curves with respect the free amplitude, cantilever constant or quality factor.
Description11th International Scanning Probe Microscopy Conference
Publisher version (URL)http://dx.doi.org/10.1016/j.ultramic.2010.02.023
Appears in Collections:(IMN-CNM) Artículos
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