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Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy

AuthorsVerdaguer, Albert CSIC ORCID; Cardellach, Mar CSIC; Segura, Juan José CSIC; Sacha, G. M.; Moser, Joel CSIC ORCID; Zdrojek, M. CSIC ORCID; Bachtold, Adrian CSIC ORCID; Fraxedas, J. CSIC ORCID
Issue Date2009
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 94(23): 233105 (2009)
AbstractBy means of scanning probe microscopy we are able to inject charges in isolated graphene sheets deposited on SiO2/Si wafers and characterize the discharge induced by water in controlled ambient conditions. Contact potential differences between the graphene surface and the probe tip, measured by Kelvin probe microscopy, show a linear relationship with the tip bias during charge injection. The discharge depends on relative humidity and decays exponentially with time constants of the order of tens of minutes. We propose that graphene discharges through the water film adsorbed on the SiO2 surface.
Description4 páginas, 3 figuras.-- Trabajo presentado como comunicación oral a la "European Conference on Surface Science ECOSS27" celbrado en Holanda en septiembre de 2010: http://www.ecoss27.eu/
Publisher version (URL)http://dx.doi.org/10.1063/1.3149770
Appears in Collections:(CIN2) Comunicaciones congresos
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