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Title

Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [ Appl. Phys. Lett. 94, 162903 (2009)]

AuthorsVlooswijk, A. H. G.; Catalán, Gustau ; Noheda, Beatriz
Issue DateJul-2010
PublisherAmerican Institute of Physics
CitationApplied Physics Letters 97(4): 046101 (2010)
Description2 páginas, 1 figura.
Publisher version (URL)http://dx.doi.org/10.1063/1.3467005
URIhttp://hdl.handle.net/10261/44534
DOI10.1063/1.3467005
ISSN0003-6951
E-ISSN1077-3118
Appears in Collections:(CIN2) Artículos
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